Electromagnetic fault injection against a complex CPU, toward new micro-architectural fault models

The last years have seen the emergence of fault attacks targeting modern central processing units (CPUs). These are analyzed at a very high abstraction level and, due to CPUs complexity, underlying effect is usually unknown. Recently, few articles focused on characterizing faults CPUs. In this article, we focus electromagnetic injection (EMFI) characterization bare-metal implementation. With approach, discover and understand new effects micro-architectural subsystems. We target BCM2837 where successfully demonstrate persistent L1 instruction cache, data cache L2 cache. also show that can corrupt memory management unit (MMU). To validate our model, realize analysis retrieve an AES key.